The quickest path to
innovative research
Park NX10 produces data you can trust, replicate,
and publish at the highest nano resolution. From
sample setting to full scan imaging,
measurement, and analysis, Park NX10 saves
you time every step of the way. With more time and
better data, you can focus on doing
more innovative research.
Innovative features for
innovative work
Park SmartScan Auto Mode
SmartScan Auto performs all the necessary operations for imaging
and intelligently decides on the optimum image quality and scan
speed, all
autonomously. SmartScan Auto is made possible by Park’s
proprietary enabling technologies. That saves you time, money,
and makes for a better end result.
Park Crosstalk Elimination Technology
Park NX10 produces data you can trust, replicate, and publish at
thehighest nano resolution.
It features the world’s only true non-contact
AFM that prolongs tip life while preserving your sample, and
flexure based independent XY and Z scanner for unparalleled
accuracy and resolution.
Park NX10 SICM Module
Park NX10 SICM Module provides nanoscale
imaging for a wide range of applications, Cell
Biology, Analytical Chemistry, Electrophysiology,
Neuroscience.
Accurate AFM Solutions
for General Research
Tall Sample
1.5 µm step height
Scan Mode : Non-contact mode, Topography from Z position
sensor
Flat Sample
Atomic steps of sapphire wafer
0.3 nm step height, Scan Mode : Non-contact mode, Topography
from Z position sensor
Hard Sample
Tungsten film
Scan Mode : Non-contact mode, Topography from Z position
sensor
Soft Sample
Collagen fibril
Scan Mode : Non-contact mode, Topography from Z position
sensor
Accurate AFM
Measurement with
Low Noise Z Detector
Low Noise Z Detector
of Park NX10 AFM
-
Key technological advance and design feature of
NX platformW
-
Noise level is the lowest in the industry,
unmatched by any other
-
Used as the default topography signal
The Z detector is the key technological advance of
the new NX-series AFM. It is a new type of strain
gauge sensor, innovated by Park. At 0.2 Angstrom,
it is the best Z-detector noise in the industry.
The noise level is low enough for Z-detector to be
used as the default topography signal.
If we compare the new NX-series AFM with
previous generation of our AFM model, XE, one can
tell the difference.
If the Z-detector noise is too high, one cannot
clearly observe the atomic steps on sapphire
wafer. The height signal from the Z detector of the
Park NX AFM has the noise level, identical to that of
the Z-voltage-based topography.
The noise level of the Z position detectors
of the Park NX
The topography images of a sapphire wafer
obtained from NX10
The noise level of the Z position detectors
of the Park XE
The topography images of a sapphire wafer
obtained from XE-100
Accurate AFM Scan by
True Non-Contact™ Mode
True Non-Contact™ Mode
True Non-Contact™ Mode is a scan mode unique
to Park AFM systems that produces high resolution
and accurate data by preventing destructive tip-sample
interaction during a scan.
Accurate Feedback by Faster Z-servo enables
True
Non-Contact AFM
-
Less tip wear → Prolonged high-resolution scan
-
Non-destructive tip-sample interaction → Minimized sample
modification
-
Maintains non-contact scan over a wide range of samples
and conditions
Unlike in contact mode, where the tip contacts
the sample continuously during a scan, or in
tapping mode, where the tip touches the sample
periodically, a tip used in non-contact mode does
not touch the sample. Because of this, use of non-contact
mode has several key advantages.
Scanning at the highest resolution throughout
imaging is now possible as the tip’s sharpness is
maintained.
The Best User
Convenience by Design
Easy Tip and Sample Exchange
The unique head design allows easy side access allowing you to easily snap new tips and samples into place by hand. The cantilever is ready for scanning without the need for any tricky laser beam alignment by using pre-aligned cantilevers mounted on to the cantilever tip holder.
Lightning Fast Automatic Tip Approach
Our automatic tip to sample approach requires no user intervention and engages in just 10 seconds after loading the cantilever. By monitoring the cantilever response to the approaching surface, Park NX10 can initiate an automatic fast tip to sample approach within 10 seconds of cantilever loading. Fast feedback by the high speed Z scanner and low noise signal processing by the NX electronics controller enable quick engagement to the sample surface without any user intervention. It just works, minimal user involvement required.
Easy, Intuitive Laser Beam Alignment
With our advanced pre-aligned cantilever holder, the laser beam is focused on the cantilever upon placement. Furthermore, the natural on-axis top-down view, the only one in the industry, allows you to easily find the laser spot. Since the laser beam falls vertically on the cantilever, you can intuitively move the laser spot along the X- and Y-axis by rotating its two positioning knobs. As a result, you can easily find the laser and position it on PSPD using our beam alignment user interface. From there, all you will need is a minor adjustment to maximize the signal to start acquiring the data.
