Park FX40

A New Class of Atomic Force Microscope:
The Automatic AFM

Automatic AFM for sample preperation

XY Stage

105 mm X 40 mm

Sample size

Up to 20 mm x 20 mm recommended,
thickness up to 20 mm

A New Class of Atomic
Force Microscope:
The Automatic AFM
Accelerate your research!

Effortlessly, get the sharpest, clearest, highest
esolution images and measurements one sample
after another on various applications. Boost your
progress and scientific discoveries through
unprecedented speed and accuracy - as the Park
FX40 autonomously images and acquires data
powered by its artificial intelligence, robotics and
machine learning capability. The Additional axis
cameras automatically align with laser beams and
photodetectors. The early warning systems and fail-safes at every step of the way allow you to focus
on your research and not the tool.

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The Most Intelligent AFM
Ever Experienced with
AI Robotics Technology
With the simple click of a button, Park FX40
automatically changes and
replaces its own tips, to avoid any contamination or
user-related errors.
Operators are offered tip choices including the type,
model, application, and usage.

Auto Probe Exchange

With automated probe exchange, you can now
replace old probes easily and safely in full
automation. Harnessing the convenience of an 8-probe cassette, along with a magnetic controlled
mechanism, the Park FX40 autonomously mounts the probes. probes.

Auto Probe Reading

The Probe Identification Camera reads the QR code imprinted on the chip carrier of a newly loaded probe and extracts and displays all pertinent information on each of the tips available, including the type, model, application, and usage. This enables you to quickly select the best probe tip for each job.

Auto Beam Alignment

Automatic Beam Alignment positions the laser beam onto the proper location of a cantilever and further optimizes the PSPD position both vertically and laterally. It shifts the X,Y and Z axis for clearer images, with no distortion, all autonomously at the click of a button.

Automatic Probe Pairing
to Sample Locations

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Sample Camera

With storage capacity for up to four different
samples simultaneously on the chuck, the sample
camera effortlessly locates the most relevant spot for scanning.

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Probe Identification Camera

Uses the right tool for the right job, with the probe
Identification camera. Instantly accesses
information on each of the tips available, including
the type, model, application, and usage. It then
selects your probe with the click of a button.

Get Smarter with
Machine Learning​

Park FX40 uses machine learning to automatically
detect whether probes are correctly positioned.
Smart vision takes it one step further by locating the position of a loaded probe to a nano level and generating error status reports if necessary, instantly comparing this data to tens of thousands of possible simulated issues which are continuously upgraded through software updates.

The Fastest and
The Most Accurate,
Scanning Mode in
Atomic Force Microscopy​

The True Non-Contact™ Mode achieves
unprecedented control over tip-sample distance at
the sub-nanometer scale.
The Park FX40 has a faster and more accurate True
Non-contact mode than any other AFM on the market.

Safety Features

Safety probe landing -
Maximizing to protect your sample​

New tip crash prevention protects the tip and AFM
scanner using a combination of software interlock
and hardware switch. Through algorithmic
programming, the Z stage can’t physically go down
any further than the limit of tip collision with the
sample surface, allowing you peace of mind for the safety of your sample and AFM.

Environmental Sensors​

SmartScan displays and stores measurements
from sensors, which measure essential
environmental conditions such as temperature,
humidity, leveling and vibration. This allows you to
compare your scanned images with different
environmental channels, providing further environmental indicators for system diagnosis.

Safety probe Pickup​

Built-in robotics and a machine-learning algorithm
detect and warn you about incorrectly placed
probes, since you can use either the automatic or
manual tip loading feature. Access various error
status report during probe loading to make sure
you have the highest degree of accuracy.

The Most Intelligent
Operating Software-
Park SmartScan for FX

Start to finish with 3 clicks of
Park SmartScan™

1. Setup,

Auto Setting

It does all your setup including the probe change, and laser alignment for imaging.

2. Position,

Sample Navigation

It performs a frequency a sweep for the cantilever, and approaches the Z-stage to the sample, all automatically. Park FX40 with its added sample camera, it facilitates you to navigate for scanning to your area of interest, effortlessly.

3. Image!

Dynamic Scanning

The system sets all the necessary parameters for optimum scanning, then engages the cantilever and starts scanning the sample. It continues to scan until the image is acquired and completed with best results.

Park AFM Modes

Park Advanced AFM Modes

Park AFMs feature a comprehensive range of scanning modes so you can collect a wide array of data types accurately and efficiently. From the world’s only True Non-Contact™ Mode that preserves tip sharpness and sample integrity to advanced Magnetic Force Microscopy, Park offers the most innovative, accurate modes in the AFM industry.