Dielectric-Piezoelectric

Dynamic Contact EFM (EFM-DC)

EFM-DC utilizes a lock-in amplifier to study the electrical properties and topography of a sample surface in a single scan, unlike the two scans required by standard EFM. Here, the cantilever is biased with an AC current different than the resonance of the cantilever. The oscillation component of the PSPD signal is extracted by the lock-in amplifier, resulting in the EFM signal.