The most affordable research grade AFM
with flexible sample handling
Park NX7 has all the state-of-the-art technology you
have come to expect from Park Systems,
at a price your lab can afford. Designed with the
same attention to detail as our more
advanced models, NX7 allows you to do your
research on time and within budget.
Accurate XY Scan by Crosstalk
Two independent, closed-loop XY and Z flexure scanners
Flat and orthogonal XY scan with low residual bow
Accurate height measurements without any need for software processing
The Most Extensible AFM Solution
The most comprehensive range of SPM modes
Advanced nanomechanical measurement modes are
supported as default enabled by NX electronic controller
The best option compatibility and upgradeability in the industry
User Experience-Driven Software
and Hardware Features
Open side access for easy sample or tip exchange
Easy, intuitive laser alignment with pre-aligned tip mount
Park SmartScan™ - AFM operating software
versatile enough to empower both novices and power users alike toward great nanoscale research
Flat Orthogonal XY
Park's Crosstalk Elimination scanner structure removes scanner bow,
allowing flat orthogonal XY scanning regardless of scan location, scan rate,
and scan size. It shows no background curvature even on flattest samples,
such as an optical flat, and with various scan offsets.
This provides you with a very accurate height measurement and precision nanometrology
for the most challenging problems in research and engineering.
Decoupled XY and Z Scanners
The fundamental difference between Park and its closest competitor
is in the scanner architecture. Park’s unique flexure based
independent XY scanner and Z scanner design allows unmatched data accuracy
in nano resolution further improved with
NX AFM Head (Z scanner) powered by NX AFM electronic controller.
Industry Leading Low Noise Z Detector
Park AFMs are equipped with the most effective low noise Z detectors
in the field, with a noise of 0.02 nm over large bandwidth. This produces highly accurate
sample topography and no edge overshoot. Just one of the many ways
Park NX series saves you time and gives you better data.
Accurate Sample Topography Measured by Low Noise Z Detector
Uses low noise Z detector signal for topography
NX electronic controller provides low Z detector noise of 0.02 nm over large bandwidth
Has no edge overshoot at the leading and trailing edges
Needs calibration done only once at the factory
Sample: 1.2 μm Nominal Step Height
(9 μm x 1 μm, 2048 pixels x 128 lines)
Better tip life,
and accuracy with
True Non-Contact™ Mode
True Non-Contact™ Mode is a scan mode unique to Park AFM systems
that produces high resolution and accurate data by preventing destructive tip-sample interaction during a scan.
Unlike in contact mode, where the tip contacts the sample continuously
during a scan, or in tapping mode, where the tip touches the sample periodically,
a tip used in non-contact mode does not touch the sample. Because of this,
use of non-contact mode has several key advantages. Scanning at
the highest resolution throughout imaging is now possible as the tip’s sharpness is
maintained. Non-contact mode avoids damaging soft samples as the tip and sample surface avoid direct contact.
Accurate Feedback by Faster Z-servo enables True Non-Contact AFM
Less tip wear → Prolonged high-resolution scan
Non-destructive tip-sample interaction → Minimized sample modification
Maintains non-contact scan over a wide range of samples and conditions
Furthermore, non-contact mode senses tip-sample interactions occurring all around the tip.
Forces occurring laterally to tip approach to the sample are detected. Therefore, tips used in non-contact mode can avoid crashing into tall structures
that may suddenly appear on a sample surface. Contact and tapping modes only detect the force coming from below the tip and are vulnerable to such crashes.
Park Advanced AFM Modes
Park AFMs feature a comprehensive range of
scanning modes so you can collect a wide array of
data types accurately and efficiently.
From the world’s only True Non-Contact™ Mode that
preserves tip sharpness and sample integrity to
advanced Magnetic Force Microscopy, Park offers
the most innovative, accurate modes in the AFM industry.