Park NX7

The most affordable research grade AFM
with flexible sample handling

XY Stage

13mm × 13 mm

Sample size

Open space up to
50 mm,
thickness up to 20 mm

The most affordable research grade AFM
with flexible sample handling

Park NX7 has all the state-of-the-art technology you
have come to expect from Park Systems,
at a price your lab can afford. Designed with the
same attention to detail as our more
advanced models, NX7 allows you to do your
research on time and within budget.

Accurate XY Scan by Crosstalk

  • Two independent, closed-loop XY and Z flexure scanners
  • Flat and orthogonal XY scan with low residual bow
  • Accurate height measurements without any need for software processing

The Most Extensible AFM Solution

  • The most comprehensive range of SPM modes
  • Advanced nanomechanical measurement modes are
    supported as default enabled by NX electronic controller
  • The best option compatibility and upgradeability in the industry

User Experience-Driven Software
and Hardware Features

  • Open side access for easy sample or tip exchange
  • Easy, intuitive laser alignment with pre-aligned tip mount
  • Park SmartScan™ - AFM operating software
    versatile enough to empower both novices and power users alike toward great nanoscale research

Flat Orthogonal XY
Scanning without
Scanner Bow

Park's Crosstalk Elimination scanner structure removes scanner bow, allowing flat orthogonal XY scanning regardless of scan location, scan rate, and scan size. It shows no background curvature even on flattest samples, such as an optical flat, and with various scan offsets. This provides you with a very accurate height measurement and precision nanometrology for the most challenging problems in research and engineering.

Decoupled XY and Z Scanners

The fundamental difference between Park and its closest competitor is in the scanner architecture. Park’s unique flexure based independent XY scanner and Z scanner design allows unmatched data accuracy in nano resolution further improved with NX AFM Head (Z scanner) powered by NX AFM electronic controller.

Industry Leading Low Noise Z Detector

Park AFMs are equipped with the most effective low noise Z detectors in the field, with a noise of 0.02 nm over large bandwidth. This produces highly accurate sample topography and no edge overshoot. Just one of the many ways Park NX series saves you time and gives you better data.

Accurate Sample Topography Measured by Low Noise Z Detector

  • Uses low noise Z detector signal for topography
  • NX electronic controller provides low Z detector noise of 0.02 nm over large bandwidth
  • Has no edge overshoot at the leading and trailing edges
  • Needs calibration done only once at the factory

Sample: 1.2 μm Nominal Step Height
(9 μm x 1 μm, 2048 pixels x 128 lines)

Better tip life,
sample preservation,
and accuracy with
True Non-Contact™ Mode

True Non-Contact™ Mode is a scan mode unique to Park AFM systems that produces high resolution and accurate data by preventing destructive tip-sample interaction during a scan.

Unlike in contact mode, where the tip contacts the sample continuously during a scan, or in tapping mode, where the tip touches the sample periodically, a tip used in non-contact mode does not touch the sample. Because of this, use of non-contact mode has several key advantages. Scanning at the highest resolution throughout imaging is now possible as the tip’s sharpness is maintained. Non-contact mode avoids damaging soft samples as the tip and sample surface avoid direct contact.

Accurate Feedback by Faster Z-servo enables True Non-Contact AFM

  • Less tip wear → Prolonged high-resolution scan
  • Non-destructive tip-sample interaction → Minimized sample modification
  • Maintains non-contact scan over a wide range of samples and conditions

Furthermore, non-contact mode senses tip-sample interactions occurring all around the tip. Forces occurring laterally to tip approach to the sample are detected. Therefore, tips used in non-contact mode can avoid crashing into tall structures that may suddenly appear on a sample surface. Contact and tapping modes only detect the force coming from below the tip and are vulnerable to such crashes.

AFM Modes

Park Advanced AFM Modes

Park AFMs feature a comprehensive range of
scanning modes so you can collect a wide array of
data types accurately and efficiently.
From the world’s only True Non-Contact™ Mode that
preserves tip sharpness and sample integrity to
advanced Magnetic Force Microscopy, Park offers
the most innovative, accurate modes in the AFM industry.