Park NX12

The most versatile AFM
for analytical chemistry

XY Stage

10 mm X 10 mm

Sample size

Open space up to
50 mm x 50 mm,
thickness up to 20 mm

A versatile microscopy
platform for analytical
chemistry researchers
and shared user facilities

  • Atomic Force Microscopy (AFM) for nanometer
    resolution imaging with electrical, magnetic,
    thermal, and mechanical property measurement capabilities
  • Pipette-based scanning system for high resolution
    Scanning Ion Conductance Microscopy (SICM),
    Scanning Electrochemical Microscopy (SECM), and
    Scanning Electrochemical Cell Microscopy (SECCM)
  • Inverted Optical Microscopy (IOM) for transparent
    material research and fluorescence microscopy integration

Proven Park NX10
performance Equipped
with Inverted Optical

Park NX12 couples the versatility and accuracy of
Park’s AFM with a sample stage for inverted optical
microscopy. This enables the study of
electrochemical properties in samples that are
transparent, opaque, soft or hard.

The perfect platform for
fundamental electrochemistry

The study of the electrochemistry of batteries, fuel
cells, sensors, and corrosion is a rapidly growing
field, yet many AFMs do not directly address
its unique needs. Park NX12 offers the
functionality and flexibility chemistry researchers
require by giving them one simple, easy-to-use
platform with all the tools they need including :

  • Versatile and easy-to-use electrochemistry cells
  • Environmental control options for inert gas and humidity
  • Bi-potentiostat compatibility

Easy to use, even for entry level

  • Scanning Electrochemical Microscopy (SECM)
  • Scanning Electrochemical Cell Microscopy (SECCM)
  • Electrochemical Atomic Force Microscopy (EC-AFM) and Electrochemical Scanning Tunneling Microscopy (EC-STM)

Easy optical access with
motorized focus stage

The system allows for top, side, and bottom optical
access to the probe from various angles during
measurements. This broad optical access
combined with the device’s modular design also
allows for the addition of optical or nano-optical add-ons.

Built with multi-user
facilities in mind

Park NX12 was built from the ground up to
accommodate the needs of multi-user facilities.
Other AFM solutions lack the required versatility
to address the diverse needs of users in these
facilities, making it difficult to justify the equipment
cost. The Park NX12, however, is built
to accommodate standard ambient AFM, in-liquid
SPM and optical imaging, making it one of the most
flexible AFMs available.

A modular platform for shared
user facilities

  • The Park NX12 is an Atomic Force Microscopy platform specifically tailored to address the needs of analytical and electrochemistry researchers as well as those working in shared use facilities.
  • It provides a versatile solution for SPM based characterization of chemical and electrochemical properties and surface characterization in both air and liquid media for a broad range of opaque and transparent materials.
  • The Park NX12 is easy to use for pipette based SPM techniques with broad visual optical access to the scanning probe.
  • The Park NX12’s reasonable price and unparalleled accuracy makes it the ideal platform for multi-user facilities as well as early career researchers.

Multiple Applications

The Park NX12 can serve a wide range of functions, including PinPoint™ in-liquid and nanomechanical mapping, inverted optical microscopy to locate transparent samples, SICM for imaging ultra-soft samples, and enhanced vision to improve optics for transparent samples.

Multiple Applications

The Park NX12 can serve a wide range of functions, including PinPoint™ in-liquid and nanomechanical mapping, inverted optical microscopy to locate transparent samples, SICM for imaging ultra-soft samples, and enhanced vision to improve optics for transparent samples.

Comprehensive force spectroscopy

The Park NX12 provides a complete package for
nanomechanical characterization in-liquid and in-air, making it ideal for a wide range of applications.


We make it easy to modify the Park NX12 to suit
the unique needs of your lab by installing optional
hardware and software add-ons even after installation.


Acquiring Current-Distance Curve of SICM on the way of pipette approach (vertical direction movement) toward sample surface is beneficial to elucidate various biological and chemical phenomena in aqueous environment.

This beneficial application can be applied to a specific and interesting object of sample, identified with SICM’s non-invasive topography. Furthermore, utilizing the ‘current-distance curve mapping’ function enables researcher to examine and acquire the current-distance curve at multiple to reach a deeper level understanding for biological and chemical reaction research.

Park SmartScan™
makes scanning fast
and simple

The Park NX12 is equipped with our SmartScan™ OS,
making it one of the easiest to use AFMs in the
market. With an intuitive but extremely powerful
interface, even untrained users can quickly scan
a sample without supervision. This lets senior
researchers focus their experience on solving bigger
problems and developing better solutions.


Shared labs often have users from a wide range of backgrounds and experience levels. The NX12 can accommodate every user with its simple point and click interface and automated SmartScan™ mode.

Here is how it works after you turn on the AFM system

1 “Setup”

A small window guides you through animation to
set the instrument and place the sample for imaging. Typically, this only takes a few minutes.

2 “Position”

The system automatically performs the frequency
sweep for the cantilever, approaches the Z-stage to
the sample, and autofocuses the sample
allowing the user to see and navigate the area of interest for imaging.

3 “Image”

The system sets all the necessary parameters for
optimum setting, then engages the cantilever and
starts scanning the sample. It continues to scan
until the image is acquired and completed.


The cantilever will disengage from the sample, and
ready for the next sample imaging.

Park AFM Modes

Park Advanced AFM Modes

Park AFMs feature a comprehensive range of scanning modes so you can collect a wide array of data types accurately and efficiently. From the world’s only True Non-Contact™ Mode that preserves tip sharpness and sample integrity to advanced Magnetic Force Microscopy, Park offers the most innovative, accurate modes in the AFM industry.