Park NX10

The premiere choice for
nanotechnology research

XY Stage

20 mm X 20 mm

Sample size

20 mm X 20 mm

The quickest path to
innovative research

Park NX10 produces data you can trust, replicate,
and publish at the highest nano resolution. From
sample setting to full scan imaging,
measurement, and analysis, Park NX10 saves
you time every step of the way. With more time and
better data, you can focus on doing
more innovative research.

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360º Simulation

Innovative features for
innovative work

Park SmartScan Auto Mode

SmartScan Auto performs all the necessary operations for imaging and intelligently decides on the optimum image quality and scan speed, all
autonomously. SmartScan Auto is made possible by Park’s proprietary enabling technologies. That saves you time, money, and makes for a better end result.

Park Crosstalk Elimination Technology

Park NX10 produces data you can trust, replicate, and publish at thehighest nano resolution.
It features the world’s only true non-contact
AFM that prolongs tip life while preserving your sample, and flexure based independent XY and Z scanner for unparalleled accuracy and resolution.

Park NX10 SICM Module

Park NX10 SICM Module provides nanoscale
imaging for a wide range of applications, Cell
Biology, Analytical Chemistry, Electrophysiology,

Accurate AFM Solutions
for General Research

Tall Sample

1.5 µm step height

Scan Mode : Non-contact mode, Topography from Z position sensor

Flat Sample

Atomic steps of sapphire wafer

0.3 nm step height, Scan Mode : Non-contact mode, Topography from Z position sensor

Hard Sample

Tungsten film

Scan Mode : Non-contact mode, Topography from Z position sensor

Soft Sample

Collagen fibril

Scan Mode : Non-contact mode, Topography from Z position sensor

Accurate AFM
Measurement with
Low Noise Z Detector

Low Noise Z Detector
of Park NX10 AFM

  • Key technological advance and design feature of
    NX platformW
  • Noise level is the lowest in the industry,
    unmatched by any other
  • Used as the default topography signal

The Z detector is the key technological advance of
the new NX-series AFM. It is a new type of strain
gauge sensor, innovated by Park. At 0.2 Angstrom,
it is the best Z-detector noise in the industry.
The noise level is low enough for Z-detector to be
used as the default topography signal.
If we compare the new NX-series AFM with
previous generation of our AFM model, XE, one can
tell the difference.
If the Z-detector noise is too high, one cannot
clearly observe the atomic steps on sapphire
wafer. The height signal from the Z detector of the
Park NX AFM has the noise level, identical to that of
the Z-voltage-based topography.

The noise level of the Z position detectors
of the Park NX

The topography images of a sapphire wafer
obtained from NX10

The noise level of the Z position detectors
of the Park XE

The topography images of a sapphire wafer
obtained from XE-100

Accurate AFM Scan by
True Non-Contact™ Mode

True Non-Contact™ Mode

True Non-Contact™ Mode is a scan mode unique
to Park AFM systems that produces high resolution
and accurate data by preventing destructive tip-sample interaction during a scan.

Accurate Feedback by Faster Z-servo enables
True Non-Contact AFM

  • Less tip wear → Prolonged high-resolution scan
  • Non-destructive tip-sample interaction → Minimized sample modification
  • Maintains non-contact scan over a wide range of samples and conditions

Unlike in contact mode, where the tip contacts
the sample continuously during a scan, or in
tapping mode, where the tip touches the sample
periodically, a tip used in non-contact mode does
not touch the sample. Because of this, use of non-contact mode has several key advantages.
Scanning at the highest resolution throughout
imaging is now possible as the tip’s sharpness is maintained.

The Best User
Convenience by Design

Easy Tip and Sample Exchange

The unique head design allows easy side access allowing you to easily snap new tips and samples into place by hand. The cantilever is ready for scanning without the need for any tricky laser beam alignment by using pre-aligned cantilevers mounted on to the cantilever tip holder.

Lightning Fast Automatic Tip Approach

Our automatic tip to sample approach requires no user intervention and engages in just 10 seconds after loading the cantilever. By monitoring the cantilever response to the approaching surface, Park NX10 can initiate an automatic fast tip to sample approach within 10 seconds of cantilever loading. Fast feedback by the high speed Z scanner and low noise signal processing by the NX electronics controller enable quick engagement to the sample surface without any user intervention. It just works, minimal user involvement required.

Easy, Intuitive Laser Beam Alignment

With our advanced pre-aligned cantilever holder, the laser beam is focused on the cantilever upon placement. Furthermore, the natural on-axis top-down view, the only one in the industry, allows you to easily find the laser spot. Since the laser beam falls vertically on the cantilever, you can intuitively move the laser spot along the X- and Y-axis by rotating its two positioning knobs. As a result, you can easily find the laser and position it on PSPD using our beam alignment user interface. From there, all you will need is a minor adjustment to maximize the signal to start acquiring the data.

Park AFM Modes

Park Advanced AFM Modes

Park AFMs feature a comprehensive range of scanning modes so you can collect a wide array of data types accurately and efficiently. From the world’s only True Non-Contact™ Mode that preserves tip sharpness and sample integrity to advanced Magnetic Force Microscopy, Park offers the most innovative, accurate modes in the AFM industry.